適用器件額定試驗功率在20W~300W的MOS管、達林頓管,
并兼容部分三極管功率器件的控殼溫狀態下穩態壽命試驗和功率老煉篩選。
適用于 F0、F1、F2(細)、F2-3(粗)、TO-3P等封裝
The system can perform CFOL test and power burn-in screening with Tc controlled for MOS&Darlinton transistor with rating power 20W~300W, and part of transistors.
Applicable to F0, F1, F2 (fine), F2-3 (coarse), To-3P and other packages.